Thick films of pure and Cr2O3 doped ZnO with various concentrations (1 wt. %, 3 wt. %, 5 wt. %,7 wt% and 10 wt% ) of Cr2O3 were prepared on alumina substrates using a screen printing technique. These films were fired at a temperature of 700ºC for two hours in an air atmosphere. Morphological, compositional and structural properties of the samples were studied using the scanning electron microscopy (SEM) and X-ray diffraction techniques respectively. Crystallite size, lattice parameters and specific surface area of undoped and doped films were determined. There is change in crystallite size, lattice parameters and specific surface area of ZnO films due to addition of Cr2O3.
Prof. Dr. Bilal BİLGİN